The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Aug. 04, 2015
Applicant:

Salesforce.com, Inc., San Francisco, CA (US);

Inventors:

Jeffrey Lallana Freschl, San Francisco, CA (US);

Kiran Hariharan Nair, Dubin, CA (US);

Assignee:

SALESFORCE.COM, INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3668 (2013.01); G06F 17/30557 (2013.01); G06F 11/3664 (2013.01); G06F 17/30306 (2013.01);
Abstract

A test system registers a series of tests that reference different software enhancements added to an application within a database system. The test system enables individual software enhancements referenced by the tests and then runs log lines through the application to produce test structured query language (SQL). The database system compares the test SQL with baseline SQL produced by the application without enabling the software enhancements. The database system executes the test SQL and captures performance metrics when the test SQL is different from the baseline SQL. Comparing SQL results avoids processing and capturing performance metrics for log lines not affected by the software enhancements. Incrementally running the log lines with one software enhancement enabled at a time also allows the test system to isolate the performance impact of individual software enhancements on the database system.


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