The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2017
Filed:
Apr. 17, 2017
Ryan Barrett, San Francisco, CA (US);
Krishna Pant, San Jose, CA (US);
Ryan Barrett, San Francisco, CA (US);
Krishna Pant, San Jose, CA (US);
COLOR GENOMICS, INC., Burlingame, CA (US);
Abstract
Techniques for using functional testing to detect run-time impacts of code modifications. A method includes accessing a workflow including a plurality of stages for processing reads. The stages are defined based on modifiable code and include a first stage for aligning reads with a corresponding portion of a reference data set and a second stage for collectively analyzing data corresponding to the aligned reads. The method includes identifying functional testing specifications to correspond with the workflow, including a definition of which stages are to be performed during functional testing, a reduced reference data set, and a set of reads. The method includes performing the functional testing using the reduced reference data set and the set of reads, detecting a result generated via the performance, and outputting the result.