The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Sep. 29, 2014
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Cyril de la Cropte de Chanterac, San Francisco, CA (US);

Manu Gulati, Saratoga, CA (US);

Erik P. Machnicki, San Jose, CA (US);

Keith Cox, Sunnyvale, CA (US);

Timothy J. Millet, Mountain View, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/32 (2006.01);
U.S. Cl.
CPC ...
G06F 1/3234 (2013.01); G06F 1/324 (2013.01); G06F 1/3206 (2013.01); G06F 1/3243 (2013.01); G06F 1/3296 (2013.01); G06F 1/3203 (2013.01); Y02B 60/1217 (2013.01); Y02B 60/1239 (2013.01); Y02B 60/1285 (2013.01);
Abstract

Embodiments of a method that allow the adjustment of performance settings of a computing system are disclosed. One or more functional units may include multiple monitor circuits, each of which may be configured to monitor a given operational parameter of a corresponding functional unit. Upon detection of an event related to a monitored operational parameter, a monitor circuit may generate an interrupt. In response to the interrupt a processor may adjust one or more performance settings of the computing system.


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