The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Mar. 21, 2014
Applicants:

Fondazione Istituto Italiano Di Tecnologia, Genoa, IT;

Baylor College of Medicine, Houston, TX (US);

Inventors:

Paolo Bianchini, Genoa, IT;

Peter Saggau, Houston, TX (US);

Alberto Diaspro, Genoa, IT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02F 1/33 (2006.01); G02B 21/16 (2006.01); G02B 27/58 (2006.01); G01N 21/64 (2006.01); G02B 27/09 (2006.01);
U.S. Cl.
CPC ...
G02F 1/33 (2013.01); G01N 21/6456 (2013.01); G02B 21/002 (2013.01); G02B 21/0036 (2013.01); G02B 21/0076 (2013.01); G02B 21/0092 (2013.01); G02B 21/16 (2013.01); G02B 27/58 (2013.01); G02B 27/09 (2013.01);
Abstract

Optical scanning system, comprising an optical system for guiding a first and a second light beam, and deflector devices for deflecting first and second light beams in a directionally variable manner. The deflector devices comprise at least one acousto-optic deflector, and the optical system is arranged in such a way that the first and second light beams are counter-propagating through the acousto-optic deflector, which is controllable for deflecting the first and second light beams simultaneously or in pulse sequence. STED microscopy apparatus comprising an optical scanning system based on acousto-optic deflectors.


Find Patent Forward Citations

Loading…