The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2017
Filed:
Mar. 05, 2014
Applicant:
Deep Imaging Technologies, Inc., Tomball, TX (US);
Inventor:
Alexander Edward Kalish, The Woodlands, TX (US);
Assignee:
Deep Imaging Technologies, Inc., Tomball, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/12 (2006.01); G01V 3/38 (2006.01); G01V 3/08 (2006.01);
U.S. Cl.
CPC ...
G01V 3/12 (2013.01); G01V 3/083 (2013.01); G01V 3/38 (2013.01);
Abstract
Concurrently measuring, correlating, and processing magnetic and electric field data includes measuring base band signals, and then up-converting those band signals to a higher frequency for filtering, while at the same time preserving phase and amplitude information. All timed elements in the system are rigorously synchronized. The increased data set results in improved signal-to-noise ratio and information correlation.