The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2017
Filed:
May. 23, 2013
Brightway Vision Ltd., Haifa, IL;
Yoav Grauer, Haifa, IL;
Ofer David, Haifa, IL;
Eyal Levi, Haifa, IL;
Ya'ara David, Kiryat Tiv'on, IL;
Haim Garten, Haifa, IL;
Alon Krelboim, Haifa, IL;
Sharon Lifshits, Haifa, IL;
Oren Sheich, Yoqneam, IL;
BRIGHTWAY VISION LTD., Haifa, IL;
Abstract
A method for gated imaging using an adaptive depth of field is provided herein. The method includes obtaining boundary conditions associated with a preliminary depth of field (DOF) parameters in a scene; illuminating the scene, using a light source, with a pulsed light beam, based on the specified boundary conditions; controlling sensor array parameters based on the boundary conditions; capturing, using the sensor array, one or more images of the scene, wherein the capturing is based on one or more exposures synchronized with the pulsed light beam, to achieve gated images of the scene in accordance with the boundary conditions associated with the DOF parameters; analyzing at least one of the captured images, using data processing algorithms, to yield updated DOF parameters; and repeating the above stages with updated sensor array parameters and updated light source parameters, based on the updated DOF parameters and updated boundary conditions.