The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2017
Filed:
Sep. 13, 2013
Schneider Electric Usa, Inc., Schaumburg, IL (US);
Issa Vignon Dramé, West Allis, WI (US);
Randall James Gass, Cedar Rapids, IA (US);
Schneider Electric USA, Inc., Andover, MA (US);
Abstract
Sampling for arc-fault detection, ground-fault detection, and grounded-neutral fault detection uses a single analog-to-digital converter (ADC). The arc-fault and ground-fault sampling occurs at regular sampling periods that are relatively short com pared to the time between them, thus allowing grounded-neutral fault sampling to occur before and/or after one of these sampling periods. A predefined event may be used to ensure the grounded-neutral fault sampling occurs immediately before and/or after one of the periodic sampling periods. The predefined event may be the expiration of a timer or the time for a sinusoidal signal in a ground fault sense circuit to make a predefined number of zero-crossings. This avoids interference between the arc-fault sampling, the ground-fault sampling and grounded-neutral fault sampling, allowing a single ADC to perform all samplings concurrently. The timing of the predefined event may be periodically reset to compensate for any changes due to temperature and/or over time.