The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2017
Filed:
Apr. 01, 2015
Renesas Electronics Corporation, Kawasaki-shi, JP;
Yukitoshi Tsuboi, Kawasaki, JP;
Hideo Nagano, Kawasaki, JP;
Hiroshi Nagaoka, Kawasaki, JP;
Yusuke Matsunaga, Kawasaki, JP;
Yutaka Igaku, Kawasaki, JP;
Naotaka Kubota, Kawasaki, JP;
Renesas Electronics Corporation, Kawasaki-shi, Kanagawa, JP;
Abstract
Deterioration in operation performance due to a fault diagnosis is prevented. A semiconductor deviceaccording to the present invention includes a plurality of CPU corestoeach including a scan chain, and a diagnostic test circuitthat performs a scan test for the plurality of CPU corestoby using the scan chain of the CPU core. The diagnostic test circuitperforms a scan test for each of the plurality of CPU corestoin a predetermined order on a periodic basis so that execution time periods of the scan tests do not overlap each other.