The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2017
Filed:
Aug. 26, 2015
Applicant:
Sysmex Corporation, Kobe-shi, Hyogo, JP;
Inventor:
Hiroyuki Matsuura, Kobe, JP;
Assignee:
Sysmex Corporation, , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/01 (2006.01); G01N 35/04 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/01 (2013.01); G01N 35/04 (2013.01); G01N 2035/00306 (2013.01); G01N 2035/00326 (2013.01); G01N 2035/0415 (2013.01);
Abstract
Disclosed is a sample analyzer including: a transport apparatus configured to transport a sample rack holding a sample container; and a measurement apparatus body configured to measure a sample in the sample container held in the sample rack transported by the transport apparatus, wherein the transport apparatus includes a light source holding unit configured to detachably hold a light source unit, and the measurement apparatus body includes a detection unit configured to detect, via an analysis specimen containing the sample, light emitted from the light source unit held in the light source holding unit.