The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Jul. 01, 2015
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventors:

Atsushi Shimaoka, Kanagawa, JP;

Tomoyuki Miyazaki, Kanagawa, JP;

Kazuhiko Hidaka, Kanagawa, JP;

Assignee:

MITOTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 11/00 (2006.01); G01B 11/14 (2006.01); G01B 5/00 (2006.01); G01B 5/012 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2441 (2013.01); G01B 5/0016 (2013.01); G01B 5/012 (2013.01); G01B 11/007 (2013.01); G01B 11/14 (2013.01);
Abstract

A measuring probe includes a stylus having a contact part to be in contact with an object to be measured, an axial motion mechanism having a moving member that allows the contact part to move in an axial direction, and a rotary motion mechanism having a rotating member that allows the contact part to move along a plane perpendicular to the axial direction by means of rotary motion. The measuring probe includes a main body housing that supports the axial motion mechanism, a module housing that supports the rotary motion mechanism, and a displacement detector supported by the main body housing for detecting displacement of the moving member. The measuring probe with this configuration ensures high measurement accuracy while keeping a low cost.


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