The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Jul. 08, 2015
Applicant:

Sick Ag, Waldkirch, DE;

Inventors:

Klemens Wehrle, Waldkirch, DE;

Long Lu, Waldkirch, DE;

Assignee:

SICK AG, Waldkirch, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G06K 9/20 (2006.01); G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G06K 7/10732 (2013.01); G06K 9/2018 (2013.01); G06K 9/2027 (2013.01);
Abstract

To obtain a high-resolution image on a detection of a contour of an object, an image detection system for detecting an object is provided which comprises a defined detection zone in which the object moved through the detection zone is detectable; at least two lighting units for lighting the detection zone with a respective light beam; and at least two light reception units for receiving light reflected at the object, wherein one respective lighting unit is associated with a light reception unit, and wherein the lighting units each transmit their light beams at a defined light wavelength and the light reception units are configured to receive a respective light wavelength of the reflected light associated with them, wherein the one light reception unit receives a different light wavelength than the other light reception unit.


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