The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 07, 2017
Filed:
Jan. 21, 2015
Applicant:
National Applied Research Laboratories, Taipei, TW;
Inventors:
Yu-Hsuan Lin, Taipei, TW;
Chih-Chung Yang, Taipei, TW;
Kuo-Cheng Huang, Taipei, TW;
Tai-Shan Liao, Taipei, TW;
Assignee:
NATIONAL APPLIED RESEARCH LABORATORIES, Taipei, TW;
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/08 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 11/08 (2013.01); G01B 11/24 (2013.01);
Abstract
A method for determining if a wire guide roller having a plurality of V-shaped grooves, each having a copper line thereon, arranged column-by-column on a periphery direction thereof is failed after slicing a plurality of wafers is disclosed. Based on the disclosed technical means, the efficacy may be achieved that a damage situation may be automatically examined and notified to maintain a yield in the slicing process in an online high speed environment.