The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Jun. 23, 2016
Applicant:

Minute Key Inc., Boulder, CO (US);

Inventors:

Richard L. Gardner, Loveland, CO (US);

Bradford Shayne Cooley, Escondido, CA (US);

David Kortbawi, Escondido, CA (US);

Assignee:

MINUTE KEY INC., Boulder, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); B23Q 35/00 (2006.01); G01B 5/00 (2006.01);
U.S. Cl.
CPC ...
B23Q 35/00 (2013.01); G01B 5/0018 (2013.01); G01B 11/24 (2013.01); B23C 2235/24 (2013.01); B23C 2235/32 (2013.01); B23C 2235/41 (2013.01); B23C 2260/56 (2013.01); B23C 2260/76 (2013.01);
Abstract

A system for duplicating a master key includes a mechanism for receiving and positioning a master key. The master key defines a major key axis and an intermediate key axis along which a key blade variably extends, and a minor key axis along a key thickness. Optical path components direct a light beam along the minor key axis. The light beam impinges upon the key blade. A portion of the light beam traverses the key blade. A detector receives the portion of the light beam that traverses the key blade. An apparatus imparts relative motion along the major key axis between the light beam and the master key. The light beam scans along the major key axis of the master key. A processor receives a signal from the detector as the beam scans along the major key axis and generates information usable for defining the machining of a duplicate key.


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