The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Apr. 01, 2016
Applicant:
Tom Haapanen, Kichener, CA;
Inventor:
Tom Haapanen, Kichener, CA;
Assignee:
RICOH COMPANY, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); H04N 1/00 (2006.01); G01P 15/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00079 (2013.01); G01P 15/001 (2013.01); H04N 1/0009 (2013.01); H04N 1/00015 (2013.01); H04N 1/00037 (2013.01); H04N 1/00058 (2013.01); H04N 1/00076 (2013.01); H04N 2201/0094 (2013.01);
Abstract
Systems, apparatuses and methods are provided to allow for detection of an impact to an output apparatus. Such impact may be caused by a sudden force applied to one or more points on the apparatus housing or another part of the apparatus accessible from outside the apparatus housing. An impact detector outputs to an apparatus controller an impact report including impact time and impact data corresponding to the detected impact event.