The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

Jul. 14, 2015
Applicant:

Infinera Corporation, Sunnyvale, CA (US);

Inventors:

Omer Faruk Yilmaz, Palo Alto, CA (US);

Ankur Neog, Bangalore, IN;

Saurabh Kumar, Menlo Park, CA (US);

Sanjeev Ramachandran, Bangalore, IN;

Assignee:

Infinera Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04J 14/02 (2006.01);
U.S. Cl.
CPC ...
H04J 14/0221 (2013.01); H04J 14/0212 (2013.01);
Abstract

A device may perform a set of sample measurements of a set of slices of spectrum utilized by an input optical signal. The device may perform an analysis of the input optical signal to determine an attenuation profile. The analysis may include identifying a channel in a particular slice of spectrum, of the set of slices of spectrum, based on an optical power of a sample measurement, of the set of sample measurements, satisfying a threshold. The device may apply the attenuation profile to the input optical signal to generate an output optical signal with a particular spectral shape. The device may provide the output optical signal with the particular spectral shape.


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