The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Mar. 25, 2016
Ciena Corporation, Hanover, MD (US);
David C. Bownass, Ottawa, CA;
Bing Liu, Ottawa, CA;
Alex W. Mackay, Ottawa, CA;
Choudhury A. Al Sayeed, Gloucester, CA;
Ciena Corporation, Hanover, MD (US);
Abstract
A frequency offset detection method in an optical spectrum measurement device, implemented by a controller, includes determining a reference optical spectrum based on expected channels and their associated spectral occupancy without extracting any information from actual received optical spectrum; obtaining a measured optical spectrum from the optical spectrum measurement device; and performing a frequency offset control loop using the reference optical spectrum and the measured optical spectrum to correct frequency offset in the optical spectrum measurement device. The optical spectrum measurement device can be an Optical Channel Monitor and the measured optical spectrum can include optical channels partially overlapping one another in Nyquist or in super-Nyquist spacing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile