The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Sep. 13, 2016
Maxphotonics Co., Ltd., Shenzhen, CN;
Shaofeng Zhou, Shenzhen, CN;
Liangjie Huang, Shenzhen, CN;
Kai Li, Shenzhen, CN;
Feng Jiang, Shenzhen, CN;
Maxphotonics Co., Ltd., Shenzhen, CN;
Abstract
The present invention discloses a method for detecting influence on a laser from back-reflected light of the laser and a detection device. The method includes: receiving laser light input by a laser; splitting the input light into first detection light and second detection light via a beam coupler having a specific distribution proportion, and outputting the first detection light and the second detection light to a first optical power meter and an adjustable reflector, respectively; receiving a part of the second detection light reflected by the adjustable reflector, splitting the part of the second detection light reflected by the adjustable reflector into first back-reflection light and second back-reflection light, and returning the first back-reflection light and the second back-reflection light to the laser and the first optical power meter, respectively, detecting power of the first detection light by using the first optical power meter, and detecting power of the second back-reflection light by using a second optical power meter, and calculating power of the input light of the laser and power of the first back-reflection light, and establishing a power corresponding relationship between the power of the first back-reflection light and the power of the input light of the laser. By means of the foregoing manner, the present invention can detect a corresponding relationship between power of back-reflection light and power of input light of a laser.