The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

Aug. 15, 2016
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Dae Hoon Kim, Gyeonggi-do, KR;

Sang Hyun Lee, Gyeonggi-do, KR;

Assignee:

SK HYNIX SYSTEM IC INC., Chungcheongbuk-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/40 (2006.01); H01L 29/78 (2006.01); H01L 29/08 (2006.01); H01L 29/10 (2006.01); H01L 29/423 (2006.01); H01L 29/06 (2006.01);
U.S. Cl.
CPC ...
H01L 29/402 (2013.01); H01L 29/0653 (2013.01); H01L 29/0847 (2013.01); H01L 29/7835 (2013.01); H01L 29/0649 (2013.01); H01L 29/1045 (2013.01); H01L 29/1083 (2013.01); H01L 29/1095 (2013.01); H01L 29/42368 (2013.01);
Abstract

A power integrated device includes a semiconductor layer having first conductivity, a source region and a drain region each having second conductivity and disposed in the semiconductor layer, wherein the source region and the drain region are spaced apart from each other, a first drift region having the second conductivity, disposed in the semiconductor layer, and surrounding the drain region, a second drift region having the second conductivity, disposed in the semiconductor layer, contacting a sidewall of the first drift region, and having an impurity concentration lower than an impurity concentration of the first drift region, a gate insulation layer disposed over a channel region between the source region and the second drift region and extending over the second drift region, a field insulation plate disposed over the second drift region and the first drift region, contacting a sidewall of the gate insulation layer, and having a planar structure, and a gate conductive pattern disposed over the gate insulation layer, wherein the gate conductive pattern extends over the field insulation plate.


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