The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

Jan. 22, 2016
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Jonathan Immanuel Sperl, Baveria, DE;

Dirk Beque, Bavaria, DE;

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
G06T 11/003 (2013.01); G01N 23/046 (2013.01); G01N 2223/401 (2013.01); G06T 2211/40 (2013.01);
Abstract

Reconstructing under-sampled PCT data includes obtaining under-sampled scan data of a subject-under-test, the object scan performed on a phase contrast computed tomography (PCT) system, performing a regularized Fourier analysis on the under-sampled scan data, correcting for one or more PCT system contributions to the under-sampled scan data by dividing the computed Fourier coefficients by Fourier coefficients representative of the one or more PCT system contributions, obtaining at least one of an absorption sinogram, a differential phase sinogram, and a dark field sinogram from the corrected Fourier coefficients, and performing tomographic reconstruction on the obtained absorption sinogram, the obtained differential phase sinogram, and the obtained dark field sinogram. A system and non-transitory computer readable medium are also disclosed.


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