The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Aug. 21, 2014
Applicant:
Dai Nippon Printing Co., Ltd., Shinjuku-ku, Tokyo, JP;
Inventors:
Assignee:
DAI NIPPON PRINTING CO., LTD., Shinjuku-ku, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); C12M 3/00 (2006.01); C12M 1/32 (2006.01); C12M 1/34 (2006.01); G06F 19/00 (2011.01); G06K 9/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); C12M 21/06 (2013.01); C12M 23/12 (2013.01); C12M 41/00 (2013.01); C12M 41/36 (2013.01); C12M 41/46 (2013.01); G06F 19/366 (2013.01); G06K 9/00134 (2013.01); G06K 9/00147 (2013.01); G06K 9/46 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01);
Abstract
Provided is a sample image management system that uses a cell culture vessel including a plurality of microwells and a plurality of first identifiers provided to the respective microwells in pairs. The sample image management system analyzes, in an enlarged sample image including a pair of the first identifier and the microwell, the microwell and the first identifier, and associates at least position information on the microwell with the enlarged sample image.