The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Jul. 07, 2015
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Hiroshi Kitajima, Kawasaki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06T 1/60 (2006.01); G06T 1/00 (2006.01); G06T 1/20 (2006.01); G06K 9/68 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 1/60 (2013.01); G06K 9/6202 (2013.01); G06K 9/6212 (2013.01); G06K 9/6857 (2013.01); G06T 1/0007 (2013.01); G06T 1/20 (2013.01); G06T 7/74 (2017.01); G06T 2207/20016 (2013.01);
Abstract
A tentative local score between a point in a feature image in a template image and a point, in a target object image, at a position corresponding to the point in the feature image is calculated, and a determination is performed as to whether the tentative local score is smaller than 0. In a case where the tentative local score is greater than or equal to 0, the tentative local score is employed as a local score. In a case where the tentative local score is smaller than 0, the tentative local score is multiplied by a coefficient and the result is employed as a degree of local similarity.