The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Nov. 18, 2016
Megachips Corporation, Osaka-shi, JP;
Kyushu Institute of Technology, Kitakyushu-shi, JP;
Norikazu Ikoma, Fukuoka, JP;
Hiromu Hasegawa, Osaka, JP;
MegaChips Corporation, Osaka-shi, JP;
Kyushu Institute of Technology, Kitakyushu-shi, JP;
Abstract
Provided is a state estimation apparatus that enables more accurate and robust detection and tracking of an object by obtaining a plurality of sets of observation data for a tracking target object and estimating the internal state of the object using a plurality of likelihoods calculated from the obtained sets of observation data. The state estimation apparatus obtains first observation data and second observation data, each of which is composed of a plurality of pieces of observation data, and obtains possibility measurement data and necessity measurement data from the obtained plurality of pieces of observation data. In the state estimation apparatus, a likelihood obtaining unit obtains a first likelihood wp and a second likelihood wn from the possibility measurement data and the necessity measurement data. Using the obtained first likelihood wp and second likelihood wn enables the internal state of the object to be estimated.