The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

Sep. 11, 2012
Applicants:

Ryota Mase, Tokyo, JP;

Kota Iwamoto, Tokyo, JP;

Inventors:

Ryota Mase, Tokyo, JP;

Kota Iwamoto, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/46 (2013.01); G06K 9/4671 (2013.01); G06K 2009/4666 (2013.01);
Abstract

The size of a feature descriptor is reduced, with the accuracy of object identification maintained. A local feature descriptor extracting apparatus includes a feature point detecting unit configured to detect a plurality of feature points in an image and output feature point information that is information on each of the feature points, a feature point selecting unit configured to select the predetermined number of feature points from the detected plurality of feature points in order of decreasing importance based on the feature point information, and a local feature descriptor generating unit configured to generate a local feature descriptor that is a feature descriptor in a local region for each of the selected feature points.


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