The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

Nov. 23, 2015
Applicant:

Maxim Integrated Products, Inc., San Jose, CA (US);

Inventor:

Gabriel E. Tanase, Cupertino, CA (US);

Assignee:

Maxim Integrated Products, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03F 3/04 (2006.01); G05F 3/26 (2006.01);
U.S. Cl.
CPC ...
G05F 3/262 (2013.01);
Abstract

A method and apparatus for current sensing and measurement employs two cascaded MOSFET current mirrors, wherein the mirrored current leaving the first current mirror is fed to the input of the second current mirror. Each current mirror contains a high current MOSFET and a low current MOSFET, connected source-to-source and gate-to-gate. The MOSFETs are matched so that drain-to-source current flowing in the high current MOSFET is proportional to the drain-to-source current flowing in the low current MOSFET. The ratio of high current to low current for each current mirror is M, where M is 100 or less. Voltage biasing networks are employed to maintain constant drain-to-source voltages for both MOSFETs in each current mirror.


Find Patent Forward Citations

Tanase, Gabriel. (2017). Method and apparatus for current sensing and measurement (U.S. Patent No. 9804629). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9804629

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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