The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Jun. 26, 2015
Applicant:
Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, Guangdong, CN;
Inventors:
Ri Hong, Guangdong, CN;
Kecheng Xie, Guangdong, CN;
Assignee:
Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, Guangdong, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); G02F 1/1368 (2006.01); G02F 1/1362 (2006.01);
U.S. Cl.
CPC ...
G02F 1/1368 (2013.01); G02F 1/136259 (2013.01); G02F 2001/136254 (2013.01); G02F 2001/136268 (2013.01);
Abstract
Disclosed is a method for detecting defects of a TFT array substrate. The method comprises steps of: positioning an abnormal area of the TFT array substrate; separating the abnormal area from other areas of the array substrate; and treating the abnormal area as such that multiple layers in the abnormal area can be revealed one by one, and detecting the revealed layers to determine a defective layer in the abnormal area.