The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

Mar. 04, 2013
Applicant:

Huron Technologies International Inc., Waterloo, Ontario, CA;

Inventors:

Arthur Edward Dixon, Waterloo, CA;

Savvas Damaskinos, Kitchener, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01); H04N 7/18 (2006.01); G02B 21/00 (2006.01); G01N 21/64 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/008 (2013.01); G01N 21/6456 (2013.01); G02B 21/0076 (2013.01); G02B 21/367 (2013.01); G01N 21/6458 (2013.01); G01N 2021/6417 (2013.01);
Abstract

An instrument and method for scanning all or part of a large specimen mounted on a specimen holder takes a plurality of measurements of each pixel in the whole or part of the specimen being scanned at a plurality of exposure values. A computer controls the movement of the specimen holder during scanning and again of the detector to produce a digitized image of all or part of the specimen with larger dynamic range than the dynamic range of the detection system. In a further embodiment, the instrument can scan two successive, identical strips at a different exposure values and combine the images from the two scans into one digitized image having a larger dynamic range than the dynamic range of the detection system.


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