The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

May. 16, 2014
Applicants:

Robert A. Estes, Tomball, TX (US);

Randy R. Riggs, Cut-N-Shoot, TX (US);

Francis Chad Hanak, League City, TX (US);

John F. Priest, Tomball, TX (US);

Inventors:

Robert A. Estes, Tomball, TX (US);

Randy R. Riggs, Cut-N-Shoot, TX (US);

Francis Chad Hanak, League City, TX (US);

John F. Priest, Tomball, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/26 (2006.01); G01V 7/00 (2006.01); G01V 7/04 (2006.01); G01V 11/00 (2006.01); G01V 13/00 (2006.01); E21B 47/09 (2012.01); G01V 3/40 (2006.01);
U.S. Cl.
CPC ...
G01V 3/26 (2013.01); E21B 47/0905 (2013.01); G01V 7/005 (2013.01); G01V 7/04 (2013.01); G01V 11/00 (2013.01); G01V 13/00 (2013.01); G01V 3/40 (2013.01); G01V 7/00 (2013.01);
Abstract

A system method and computer-readable medium for correcting measurements obtained by a down hole tool for residual measurement errors is disclosed. A down hole tool having at least two directional field sensors is disposed in a borehole. The at least two directional sensors are substantially orthogonal to each other and to a longitudinal axis of the down hole tool. Measurements are obtained from the at least two directional sensors during rotation of the tool by at least 360 degrees around the longitudinal axis of the tool. Residual measurement errors are determined for the obtained measurements, and a quality level of the determined residual measurement errors selected. The determined residual measurement errors are applied to the obtained measurements when the determined residual measurement errors are consistent with the selected quality level. In various embodiments, the residual measurement errors are reduced from a first value that does not match the selected quality level to a second value that are consistent with the selected quality level.


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