The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Nov. 19, 2013
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Xiaofeng Niu, Mundelein, IL (US);
Wenli Wang, Briarcliff Manor, NY (US);
Hongwei Ye, Kenosha, WI (US);
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Abstract
A method and apparatus for generating crystal efficiency correction factors by performing a normalization calibration based on delayed data. The method and apparatus obtain delayed data from a scan of a patient using a Positron Emission Tomography (PET) scanner, generate a sinogram from the obtained delayed data, determine, using a processing circuit, mean fan and block line of response sensitivities from the generated sinogram, determine, using the processing circuit, mean detector efficiency based on the determined mean fan and block line of response sensitivities, determine, using the processing circuit, an individual crystal efficiency based on the determined mean fan and block line of response sensitivities and the mean detector efficiency for each module, and calculate the crystal efficiency correction factors based on the determined individual crystal efficiency of each module.