The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Sep. 15, 2015
Applicant:
Panasonic Corporation, Osaka, JP;
Inventors:
Yaesuk Jeong, Marlborough, MA (US);
Farrokh Ayazi, Marlborough, MA (US);
Assignee:
PANASONIC CORPORATION, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 21/00 (2006.01); G01P 15/125 (2006.01);
U.S. Cl.
CPC ...
G01P 21/00 (2013.01); G01P 15/125 (2013.01);
Abstract
A system and calibration method utilizes time averaging to suppress inherent capacitance mismatches or temperature variations in MEMS devices, such as a tri-axial accelerometer. An calibration interface circuit, operatively coupled the MEMS sensor, effectively cancels a range of non-ideal capacitive mismatches by employing pockets of calibration charges that are controlled by the duty-cycle of a clock.
Jeong, Yaesuk. (2017). Apparatus and method for calibration of capacitance mismatch and temperature variations in a mems device (U.S. Patent No. 9804190). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9804190
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile