The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

Oct. 09, 2013
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Falk Schlaudraff, Butzbach/Nieder-Weisel, DE;

Florian Hoffmann, Giessen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/483 (2006.01); G01N 1/28 (2006.01);
U.S. Cl.
CPC ...
G01N 33/483 (2013.01); G01N 1/2813 (2013.01); G01N 2001/282 (2013.01); G01N 2001/2886 (2013.01);
Abstract

A method for laser microdissection of a laser microdissection region of a prepared specimen includes driving a holder for the specimen into a holding position using a control device. First and second digital images are captured that depict a same portion of the prepared specimen, with the first image depicting the portion under at least one first microscopic examination method and the second image depicting the portion under at least a second microscopic examination method. A live overlay image is generated of the portion of the prepared image in a live mode. The live overlay is presented on a display area with the images overlaid onto one another. A marking is generated and captured on the live overlay image so as to define the laser microdissection region.


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