The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

Dec. 04, 2015
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Sadato Hongo, Yokohama, JP;

Hirohisa Miyamoto, Kamakura, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/40 (2006.01); G01N 33/543 (2006.01); G01N 15/12 (2006.01); B82Y 5/00 (2011.01); B82Y 15/00 (2011.01);
U.S. Cl.
CPC ...
G01N 27/40 (2013.01); G01N 15/12 (2013.01); G01N 33/54346 (2013.01); G01N 33/54366 (2013.01); B82Y 5/00 (2013.01); B82Y 15/00 (2013.01); G01N 2015/1236 (2013.01);
Abstract

According to one embodiment, a method for detecting a sample includes preparing a device for detecting a sample, the device including a measurement cassette, a first chamber formed by partitioning the cassette with a partition wall, a through-hole provided in the partition wall, a first electrode provided in the cassette, and a second electrode provided in the cassette, introducing a reagent and a sample containing a measuring object substance into the first chamber, introducing a conductive liquid into the second chamber, supplying current to the through-hole, allowing the measuring object substance whose surface is bound to and is covered by the tag particles via the capture substance in the first chamber to pass through the through-hole, and detecting presence of the measuring object substance.


Find Patent Forward Citations

Loading…