The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Dec. 23, 2014
Robert R. Alfano, Bronx, NY (US);
Yang Pu, Irvine, CA (US);
Robert R. Alfano, Bronx, NY (US);
Yang Pu, Irvine, CA (US);
Other;
Abstract
Spatial frequency spectra from periodic, aperiodic and quasi-random structures in materials are shown and used to detect differences among objects via internal coding from the spatial frequencies. The method is applied to different grades of human tissues for a new form of histology and pathology, and to detect art forgeries and coding boxes, money and papers and gems. The randomness of material structures on surface and at depths near surface can be detected from the spatial spectrum. In tissue spectral features from normal to different stages of cancer in tissue for ex vivo and in vivo applications can be recognized by different spectral fingerprints content of the spatial frequency. Similarly, the painting for the strokes of artist is different. A new type of instrument is described to analyze materials as a Spatial Frequency Spectrometer.