The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Sep. 13, 2013
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Assignee:
NEC Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/28 (2006.01); G01N 29/34 (2006.01); G01M 3/00 (2006.01); G01M 5/00 (2006.01); G01M 7/02 (2006.01); G01M 3/24 (2006.01); F17D 5/06 (2006.01);
U.S. Cl.
CPC ...
G01M 5/0025 (2013.01); F17D 5/06 (2013.01); G01M 3/00 (2013.01); G01M 3/243 (2013.01); G01M 5/0033 (2013.01); G01M 7/02 (2013.01); G01N 29/04 (2013.01); G01N 29/28 (2013.01); G01N 29/341 (2013.01);
Abstract
The present invention provides a defect analysis device including: an excitation unit () that imparts vibrations of a plurality of frequencies to a fluid () flowing through a pipe (); a first detector () that, when the excitation part () is imparting vibrations, detects vibrations emanating from the pipe (); and a signal processing unit () that extracts a feature quantity from a vibration waveform acquired by the first detector (), and uses the extracted feature quantity to estimate the extent of a defect formed in the pipe ().