The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Feb. 25, 2013
Iwasaki Electric Co., Ltd., Tokyo, JP;
Tetsuji Yamada, Tokyo, JP;
Kosuke Oshima, Tokyo, JP;
IWASAKI ELECTRIC CO., LTD., Tokyo, JP;
Abstract
A glare measuring system is configured to have an imaging camera which is supported to be rotatable within a horizontal plane, and a processing device which calculates equivalent veiling luminance on the basis of a pickup image of the imaging camera and calculates the value of a glare rating GR on the basis of the equivalent veiling luminance. The imaging camera has a super-wide-angle lens mounted thereon, and picks up an image in a position which is rotated within the horizontal plane by every angle corresponding to the angle of view α of the super-wide-angle. The processing device combines pickup images to generate a composite image in which a glare measurement direction is set to the center of the composite image, calculates equivalent veiling luminance on the basis of the composite image, and calculates the value of the glare rating in the glare measurement direction.