The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

Apr. 22, 2015
Applicants:

Francesco Simonetti, Cincinnati, OH (US);

Geir Instanes, Nesttun, NO;

Inventors:

Francesco Simonetti, Cincinnati, OH (US);

Geir Instanes, Nesttun, NO;

Assignee:

Clamp On AS, Bergen, NO;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01B 17/02 (2006.01);
U.S. Cl.
CPC ...
G01B 17/02 (2013.01); G01N 29/041 (2013.01);
Abstract

A method and an apparatus for guided-wave tomographic measurement or monitoring of wall thicknesses of the walls of pipes and similar structures are disclosed. The method is characterized in that use is made of transducers () preferably positioned in at least two groups of a plurality of transducers ('-″) arranged in a spaced apart pattern on the external surface of the structures, the transducers individually transmit ultrasound signal into the pipe wall, in that each ultrasound signal propagates within the pipe wallfrom the transmitting transducer and is received at one or several receiving transducers, and the received ultrasound signal is converted to an electrical signal by the receiving transducers and recorded by the transceiver (). Measurements are performed by using a further plurality of transducers () that are placed apart from the two groups of a plurality of transducers (′-″). There is also disclosed a method for guided-wave tomographic measurement or monitoring of wall thicknesses in the walls of pipes and similar structures producing a set of measurement data by using the apparatus.


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