The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Dec. 13, 2011
Applicants:
Evi Goos, Heroldsbach, DE;
Christof Donitzky, Eckental, DE;
Christian Wuellner, Moehrendorf, DE;
Inventors:
Assignee:
Wavelight GmbH, Erlangen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 9/008 (2006.01); B23K 26/06 (2014.01); B23K 26/70 (2014.01); A61B 17/00 (2006.01); A61B 18/00 (2006.01);
U.S. Cl.
CPC ...
A61F 9/00802 (2013.01); B23K 26/0626 (2013.01); B23K 26/705 (2015.10); A61B 2017/00482 (2013.01); A61B 2018/00988 (2013.01); A61F 2009/00855 (2013.01);
Abstract
A test device to calibrate the pulse energy of a laser device which provides pulsed laser radiation includes a measuring head with multiple measuring probes. The test device is used in such a way that by means of the laser radiation, multiple test ablations are made on a test surface, in an arrangement corresponding to the relative spatial arrangement of the measuring probes, and the depths of the test ablations are then measured, with simultaneous use of the multiple measuring probes of the measuring head.