The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Nov. 17, 2015
Applicants:
GE Wang, Loudonville, NY (US);
Yan Xi, Troy, NY (US);
Wenxiang Cong, Albany, NY (US);
Inventors:
Assignee:
Rensselaer Polytechnic Institute, Troy, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 5/16 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01); G06T 11/00 (2006.01); G21K 1/02 (2006.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); A61B 6/032 (2013.01); A61B 6/4035 (2013.01); A61B 6/4233 (2013.01); A61B 6/4291 (2013.01); A61B 6/5205 (2013.01); G06T 11/005 (2013.01); G21K 1/025 (2013.01); G21K 2207/005 (2013.01);
Abstract
Systems and methods for X-ray phase-contrast imaging (PCI) are provided. A quasi-periodic phase grating can be positioned between an object being imaged and a detector. An analyzer grating can be disposed between the phase grating and the detector. Second-order approximation models for X-ray phase retrieval using paraxial Fresnel-Kirchhoff diffraction theory are also provided. An iterative method can be used to reconstruct a phase-contrast image or a dark-field image.