The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Sep. 08, 2014
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Chunguang Cao, Buffalo Grove, IL (US);
Xiaolan Wang, Buffalo Grove, IL (US);
Yu Zou, Naperville, IL (US);
Toshiba Medical Systems Corporation, Otawara-shi, JP;
Abstract
A method and apparatus for estimating a parameter vector including a plurality of parameters of a detector response model of a photon-counting detector. The method includes calculating a modeled spectrum based on an input spectrum and an initial value of the plurality of parameters. For each detector, a difference between the normalized photon count of the measured spectrum and the normalized modeled spectrum is calculated. A root mean square error (RMSE) between the measured and modeled spectra is obtained by squaring the normalized difference and weighting the normalized difference by a weighting factor. The parameter vector is updated until an optimum RMSE value is achieved. Upon determining optimal values of the parameter vector, measured data that is obtained via a patient scan is corrected based on the optimal parameter vector.