The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Sep. 10, 2015
Applicant:
University of Washington, Seattle, WA (US);
Inventor:
Richard S. Johnston, Sammamish, WA (US);
Assignee:
University of Washington, Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 5/357 (2011.01); G06K 9/20 (2006.01); G06K 9/30 (2006.01); H04N 1/107 (2006.01); G02B 26/10 (2006.01); H04N 7/18 (2006.01); H04N 17/00 (2006.01); G06F 3/00 (2006.01); H04N 5/225 (2006.01); G02B 23/24 (2006.01);
U.S. Cl.
CPC ...
H04N 5/357 (2013.01); G02B 26/103 (2013.01); G06F 3/002 (2013.01); G06K 9/20 (2013.01); G06K 9/209 (2013.01); G06K 9/30 (2013.01); H04N 1/107 (2013.01); H04N 5/2256 (2013.01); H04N 7/18 (2013.01); H04N 17/002 (2013.01); G02B 23/24 (2013.01); G02B 26/105 (2013.01);
Abstract
The present invention provides software, methods, and systems for characterizing an actual scan pattern of a scanning beam device. The characterization of the actual scan pattern may be used in an image remapping method and/or a drive signal remapping method to reduce distortions in an image.