The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

May. 06, 2015
Applicant:

Honeywell International Inc., Morristown, NJ (US);

Inventors:

Eric D. Knapp, Milton, NH (US);

Sinclair Koelemij, Velsen-Zuid, NL;

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); H04L 29/06 (2006.01); G06F 3/0484 (2013.01); G06F 3/0481 (2013.01); G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
H04L 63/1433 (2013.01); G06F 3/04817 (2013.01); G06F 3/04842 (2013.01); G06F 21/57 (2013.01);
Abstract

A method includes identifying multiple devices or groups of devices in an industrial process control and automation system. The method also includes, for each device or group of devices, (i) obtaining impact values identifying potential effects of a failure or compromise of the device or group of devices due to one or more cyber-security risks and (ii) identifying a consequence value using the impact values. Multiple impact values associated with different categories of potential effects are obtained, and the consequence value identifies an overall effect of the failure or compromise of the device or group of devices.


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