The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Dec. 18, 2016
Keysight Technologies, Inc., Minneapolis, MN (US);
Gregory S. Lee, Mountain View, CA (US);
Christopher Coleman, Santa Clara, CA (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A test system for testing a DUT includes near field and intermediate field measurement devices located in a near field and an intermediate field, respectively, of the DUT antenna that sample first and second bounded radiation surfaces, respectively, comprising RF signals emitted by the DUT antenna in at least first and second directions in which the bounded radiation surfaces extend. A receiver of the test system generates first and second matrices of near field and intermediate field values, respectively, from the samples obtained by the near field and intermediate field measurement devices, respectively and inputs them to processing logic of the test system. The processing logic processes the first and second matrices of near field and intermediate field values, respectively, and derives a third matrix of near field phase values therefrom.