The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
May. 01, 2014
National Instruments Corporation, Austin, TX (US);
Garritt W. Foote, Austin, TX (US);
Hector Rubio, Austin, TX (US);
NATIONAL INSTRUMENTS CORPORATION, Austin, TX (US);
Abstract
Provided is a method for processing data samples from a plurality of data channels. The method may include obtaining a plurality of data samples from the plurality of data channels. Obtaining the plurality of data samples may involve successively obtaining a data sample from each data channel of the plurality of data channels. Successively obtaining a data sample from each data channel may be performed a plurality of times during a specified time period. Each data sample of the plurality of data samples may be associated with a respective sample time, and each respective sample time may be relative to a single specified reference point in time. The method may further include, for each data sample of the plurality of data samples, determining a time-dependent coefficient value that may correspond to the sample time associated with the data sample, and applying the determined time-dependent coefficient value to the data sample.