The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

Nov. 28, 2013
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Yuko Kobayashi, Kusatsu, JP;

Tairo Ogura, Columbia, MD (US);

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/26 (2006.01); H01J 49/00 (2006.01); G01N 30/72 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/005 (2013.01); G01N 30/7266 (2013.01); H01J 49/0036 (2013.01); H01J 49/4215 (2013.01);
Abstract

In a mass spectrometric method of the invention, a mass spectrometer () is used having a mass separation unit () before and after a collision cell () for fragmenting ions. When a product ion corresponding to a precursor ion set for a sample is selected by performing product ion scan with respect to the precursor ion, an exclusion range of mass-to-charge ratios is set based on information on non-selection ions input by a user, and a product ion that satisfies a predefined criterion is selected within a range of mass-to-charge ratios excluding the exclusion range in a product ion spectrum. According to the mass spectrometric method of the invention, product ions suited for measurement on a target compound can be selected.


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