The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Feb. 03, 2015
Applicant:
Academia Sinica, Taipei, TW;
Inventors:
Assignee:
ACADEMIA SINICA, , TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/08 (2006.01); H01J 35/30 (2006.01); G06T 11/00 (2006.01); A61B 6/00 (2006.01); G01N 23/04 (2006.01); G01N 23/20 (2006.01);
U.S. Cl.
CPC ...
H01J 35/08 (2013.01); A61B 6/40 (2013.01); G06T 11/006 (2013.01); H01J 35/30 (2013.01); A61B 6/5205 (2013.01); G01N 23/04 (2013.01); G01N 23/20075 (2013.01); H01J 2235/086 (2013.01);
Abstract
The present invention relates to a method, a system, and a light source for penetrating radiation imaging, and more particularly, to a method, a system, and a light source for X-ray imaging. The system for X-ray phase contrast and high resolution imaging of the present invention comprises an X-ray source comprising a plurality of X-ray micro-light sources, an X-ray sensor configured to receive X-rays penetrating an object, and a computer configured to receive and compute raw image data from the X-ray sensor so as to obtain a clear image of the object.