The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

Aug. 30, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

John K. DeBrosse, Colchester, VT (US);

Matthew R. Wordeman, Kula, HI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/16 (2006.01); H01L 23/528 (2006.01); H01L 43/08 (2006.01); H01L 27/22 (2006.01);
U.S. Cl.
CPC ...
G11C 11/1675 (2013.01); G11C 11/16 (2013.01); G11C 11/1673 (2013.01); H01L 23/528 (2013.01); H01L 27/228 (2013.01); H01L 43/08 (2013.01);
Abstract

Improved STT MRAM midpoint reference cell configurations are provided. In one aspect, a STT MRAM midpoint reference cell includes: a plurality of word lines having at least one write reference word line and at least one read reference word line; a plurality of bit lines perpendicular to the word lines; at least one source line perpendicular to the bit lines; at least one first magnetic tunnel junction in series with i) a first field effect transistor gated by the write reference word line and ii) a second field effect transistor gated by the read reference word line; and at least one second magnetic tunnel junction in series with iii) a third field effect transistor gated by the write reference word line and iv) a fourth field effect transistor gated by the read reference word line. A method of operating a STT MRAM midpoint reference cell is also provided.


Find Patent Forward Citations

Loading…