The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

Mar. 14, 2014
Applicant:

Affinnova, Inc., Waltham, MA (US);

Inventors:

Kevin D. Karty, Lincoln, MA (US);

Steven H. Lamoureux, Boston, MA (US);

Jenkin Espinosa Lee, Sparta, NJ (US);

Mark Gerard Flynn, Somerville, MA (US);

Xinyan Chen, Charlottesville, VA (US);

Assignee:

The Nielsen Company (US), LLC, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01); G06Q 30/00 (2012.01); G06Q 30/02 (2012.01); G06N 3/12 (2006.01);
U.S. Cl.
CPC ...
G06Q 30/0201 (2013.01); G06N 3/126 (2013.01);
Abstract

A method includes determining a plurality of data points, determining a distance between each data point and each of the other plurality of data points, choosing a first one of the plurality of data points, identifying all of the other plurality of data points within a maximum distance of the chosen data point, repeating steps the previous steps to choose a different one of the plurality of data points until all of the data points have been chosen, identifying one or more clusters each having a predefined minimum number, K, of data points within a predefined search radius and analyzing the one or more clusters with respect to K linkages.


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