The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Dec. 12, 2013
Hefei Xinsheng Optoelectronics Technology Co., Ltd., Hefei, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Mingting Weng, Beijing, CN;
Zhiguang Guo, Beijing, CN;
Sixiang Wu, Beijing, CN;
Dafu Cheng, Beijing, CN;
Hefei Xinsheng Optoelectronics Technology Co., Ltd., Hefei, CN;
BOE Technology Group Co., Ltd., Beijing, CN;
Abstract
An embodiment of the present invention discloses a material management and control system, which comprises: a code scanner, which performs code scanning operation on any material to be warehoused with respect to the material to be warehoused to obtain code scanning parameter information of the material to be warehoused, wherein the code scanning parameter information comprises at least a date when a life of the material to be warehoused is exhausted; and a processor, which determines whether a remaining life of the material to be warehoused is not less than a set life value or not according to the code scanning parameter information obtained by the code scanner, and if a result is yes, then perform warehousing operation on the material to be warehoused, and monitor whether the warehoused material arrives at its corresponding life exhausting date or not, and if the result is not, then perform subsequent material processing operation on the warehoused material according to a set operation procedure. The embodiment of the present invention can greatly avoid the problems of low management and control efficiency and relatively high error rate caused by manual material management, achieve computerization of material management and control during the ODF process, and improve the processing efficiency and accuracy of the material management and control.