The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Mar. 19, 2015
A9.com, Inc., Palo Alto, CA (US);
Ming Du, Redwood City, CA (US);
Arnab Sanat Kumar Dhua, Mountain View, CA (US);
Michael Patrick Cutter, Santa Cruz, CA (US);
A9.COM, INC., Palo Alto, CA (US);
Abstract
The accuracy of an image matching process can be improved by determining relevant swatch regions of the images, where those regions contain representative patterns of the items of interest represented in those images. Various processes examine a set of visual cues to determine at least one candidate object region, and then collate these regions to determine one or more representative swatch images. For apparel items, this can include locating regions such as an upper body region, torso region, clothing region, foreground region, and the like. Processes such as regression analysis or probability mapping can be used on the collated region data (along with confidence and/or probability values) to determine the appropriate swatch regions.