The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

May. 09, 2013
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Seung-ho Park, Seoul, KR;

Se-hyeok Park, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06K 9/00 (2006.01); G06T 7/285 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00201 (2013.01); G06T 7/285 (2017.01);
Abstract

A method and apparatus for processing a multi-view image is provided. The method includes: extracting disparity information between an image of a first point of view and an image of a second point of view; and estimating a motion between two sequential images of the first point of view or the second point of view using the extracted disparity information. The apparatus may include a processor which is configured to extract disparity information between an image of a first point of view and an image of a second point of view in the multi-view image and is further configured to estimate a motion using the extracted disparity information between two sequential images of the first point of view or the second point of view.


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