The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

Sep. 08, 2015
Applicants:

Toyota Motor Engineering & Manufacturing North America, Inc., Erlanger, KY (US);

University Joseph Fourier, Saint-Martin-d'Hères, Grenoble, FR;

Inventors:

James P. Kapinski, Redondo Beach, CA (US);

Jyotirmoy V. Deshmukh, Torrance, CA (US);

Xiaoqing Jin, Torrance, CA (US);

Thao Dang, Gieres, FR;

Tommaso Dreossi, Gieres, FR;

Assignees:

TOYOTA MOTOR ENGINEERING & MANUFACTURING NORTH AMERICA, INC., Erlanger, KY (US);

UNIVERSITY JOSEPH FOURIER, Saint-Martin-D'Hères, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3676 (2013.01); G06F 11/3648 (2013.01);
Abstract

A computer-implemented method for automatically identifying a faulty behavior of a control system. The method includes receiving, at a test processor, a description of the faulty behavior. The method also includes selecting, using the test processor, a goal state based on a heuristic decision. The method also includes selecting, using the test processor, a selected system state. The method also includes selecting, using the test processor, a selected variable to the control system based on the goal state. The method also includes loading, from a memory, a control model of the control system. The method also includes performing, using the test processor, a simulation of the control model using the selected variable and the selected system state as parameters of the simulation. The method also includes determining, using the test processor, whether the faulty behavior was observed based on the simulation.


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